TY  - JOUR
AU  - Rossi, Anil
AU  - Karim, Karim
AU  - Suzuki, Tariq
AU  - Patel, Lakshmi
TI  - Strain Gauge Measurement for CMOS Logic Circuits: A Bangladesh Perspective
JO  - Open Access Journal of Engineering Applications
PY  - 1991
VL  - 15
IS  - 1
SP  - 321
EP  - 340
AB  - The economic importance of telecommunication systems to the national economy justifies a closer study of CMOS logic circuits. The proposed procedure combines strain gauge measurement with a simple iterative scheme suited to desk computation. The scheme converges within 7 iterations for all cases of practical interest. The approach is likely to be of particular benefit where resources are severely constrained.
KW  - CMOS logic circuits
KW  - strain gauge measurement
KW  - pattern recognition
KW  - irrigation
KW  - kalman filter
SN  - 3105-7004
DO  - 10.55555/oajea.1991.1501.016
UR  - https://journal.bsaps.com/article/6783
ER  -