Spectral Analysis for Thin-Film Deposition: A Preliminary Assessment
Takashi Park
Corresponding
Massachusetts Institute of Technology
Rezaul Das
Indian Institute of Technology, Kharagpur
Kamrul Tanaka
University of Dhaka
Kenji Dlamini
University of Toronto
Abstract
The high cost of imported equipment motivates an indigenous investigation of thin-film deposition suited to local groundwater aquifers. The proposed procedure couples spectral analysis with established empirical correlations. Predicted values agree with the measurements to within 50%, which is adequate for engineering design. The investigation highlights several avenues that merit closer attention in future research.
Keywords:
thin-film depositionspectral analysisearthquake engineeringfracture mechanicsinternal combustion engine
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