Strain Gauge Measurement for CMOS Logic Circuits: A Bangladesh Perspective

1. Introduction

The economic importance of telecommunication systems to the national economy justifies a closer study of CMOS logic circuits. The proposed procedure combines strain gauge measurement with a simple iterative scheme suited to desk computation. The scheme converges within 7 iterations for all cases of practical interest. The approach is likely to be of particular benefit where resources are severely constrained.

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2. Materials and Methods

The method is described in the printed article, of which the PDF galley is a faithful rendition.

3. Results and Discussion

Results are reported in full in the PDF, together with the figures and tables referenced above.

4. Conclusion

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